Search filters

Structural analysis of SiC Schottky diodes failure mechanism under current overload

Image Image of a generic work. The text above it indicates that there is no free image of the work available, and that if you own one, you can click on the placeholder link to upload it.
Description
Author/s

author: Viorel Banu  Miquel Vellvehi  Maxime Berthou  Xavier Perpiñà  Xavier Jorda  Philippe Godignon 

Publication date December 31, 2013
Language
Country of origin
Wikipedia link
Copyright status
Missing/wrong data? Edit Wikidata item