The role of defects in fluorescent silicon carbide layers grown by sublimation epitaxy
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| Description | scholarly article by Saskia Schimmel et al published 31 March 2014 in IOP Conference Series: Materials Science and Engineering |
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author: Yiyu Ou Valdas Jokubavicius Haiyan Ou Jianwu Sun Saskia Schimmel |
| Publication date | March 31, 2014 |
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