Structural characterization of V2O5–TiO2 thin films deposited by RF sputtering from a titanium target with vanadium insets
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| Description | scholarly article by I. Alessandri et al published August 2005 in Sensors and Actuators B |
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author: Elza Bontempi Elisabetta Comini Laura E Depero Giorgio Sberveglieri |
| Publication date | August 2005 |
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