Triplet excitons as sensitive spin probes for structure analysis of extended defects in microcrystalline silicon
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| Description | scholarly article in Physical Review B, vol. 94 no. 4, July 2016 |
| Author/s |
author: Jan Behrends Oleksandr Astakhov |
| Publication date | July 6, 2016 |
| Language | English |
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