Missing/wrong data? Edit Wikidata item
Electronic structure of thin film silicon oxynitrides measured using soft x-ray emission and absorption
Author/s
Work details
Publication date:
September 15, 2003
Language:
English
Copyright status
Copyright status information is not available for this work. The copyright status depends on the jurisdiction, the author's date of death and the date the work was created or published.
To learn more about copyright terms in different countries, visit the countries and terms page.