Interfacial abruptness in axial Si/SiGe heterostructures in nanowires probed by scanning capacitance microscopy
| Image |  |
|---|---|
| Description | |
| Author/s |
author: Thierry Baron Gilles Patriarche Laurence Latu-Romain |
| Publication date | January 28, 2014 |
| Language | |
| Country of origin | |
| Wikipedia link | |
| Copyright status | |
| Missing/wrong data? | Edit Wikidata item |