Nondestructive Characterization of Residual Threading Dislocation Density in HgCdTe Layers Grown on CdZnTe by Liquid-Phase Epitaxy

Image Image of a generic work. The text above it indicates that there is no free image of the work available, and that if you own one, you can click on the placeholder link to upload it.
Description
Author/s

author: Gilles Patriarche  Konstantinos Pantzas 

Publication date May 3, 2016
Language
Country of origin
Wikipedia link
Copyright status
Missing/wrong data? Edit Wikidata item