Search filters

Pattern matching, simulation, and metrology of complex layouts fabricated by electron beam lithography

Image Image of a generic work. The text above it indicates that there is no free image of the work available, and that if you own one, you can click on the placeholder link to upload it.
Description scholarly article by N. Tsikrikas et al published 2007 in Journal of Vacuum Science & Technology B
Author/s

author: Annamaria Gerardino 

Publication date 2007
Language
Country of origin
Wikipedia link
Copyright status
Missing/wrong data? Edit Wikidata item