Structural and optical studies of strain relaxation in Ge1−xSnx layers grown on Ge/Si(001) by molecular beam epitaxy
| Image |  |
|---|---|
| Description | |
| Author/s |
author: N.V. Safriuk Vasyl Kladko |
| Publication date | August 2016 |
| Language | |
| Country of origin | |
| Wikipedia link | |
| Copyright status | |
| Missing/wrong data? | Edit Wikidata item |