Conductivity and Charge Trapping After Electrical Stress in Amorphous and Polycrystalline $\hbox{Al}_{2}\hbox{O}_{3}\hbox{-Based}$ Devices Studied With AFM-Related Techniques
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author: Marc Porti Xavier Aymerich Paweł Piotr Michałowski Montserrat Nafria |
| Publication date | March 2011 |
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