Sin2 ψ analysis in thin films using 2D detectors: Non-linearity due to set-up, stress state and microstructure
| Image |  |
|---|---|
| Description | article published in 2013 |
| Author/s |
author: Damien Faurie |
| Publication date | March 2013 |
| Language | |
| Country of origin | |
| Wikipedia link | |
| Copyright status | |
| Missing/wrong data? | Edit Wikidata item |