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Observation of ultralow-level Al impurities on a silicon surface by high-resolution grazing emission x-ray fluorescence excited by synchrotron radiation

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Description scholarly article in Physical Review B, vol. 80 no. 11, September 2009
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author: Aldona Kubala-Kukuś  Yves Kayser  Jakub Szlachetko  Wei Cao  Dariusz Banaś 

Publication date September 21, 2009
Language English
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