Depth profiles of Al impurities implanted in Si wafers determined by means of the high-resolution grazing emission X-ray fluorescence technique
| Image |  |
|---|---|
| Description | |
| Author/s |
author: Aldona Kubala-Kukuś Yves Kayser Jakub Szlachetko Wei Cao Dariusz Banaś |
| Publication date | June 2010 |
| Language | |
| Country of origin | |
| Wikipedia link | |
| Copyright status | |
| Missing/wrong data? | Edit Wikidata item |