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A von Hamos x-ray spectrometer based on a segmented-type diffraction crystal for single-shot x-ray emission spectroscopy and time-resolved resonant inelastic x-ray scattering studies

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Description scientific article published on 01 October 2012
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author: Jacinto Sá  Maarten Nachtegaal  Olga Safonova  Yves Kayser  Jeroen A van Bokhoven  Bernd Schmitt  Jakub Szlachetko  Anna Bergamaschi  Paweł Jagodziński 

Publication date October 1, 2012
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