Self-trapping in B-doped amorphous Si: Intrinsic origin of low acceptor efficiency
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| Description | scholarly article in Physical Review B, vol. 81 no. 3, January 2010 |
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author: Iván Santos Wolfgang Windl Pedro Castrillo Lourdes Pelaz David Drabold |
| Publication date | January 19, 2010 |
| Language | English |
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