Determination of the valence band offsets at HfO2/InN(0001) and InN/In0.3Ga0.7N(0001) heterojunctions using X-ray photoelectron spectroscopy
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author: Anja Eisenhardt Andreas Knübel Marcel Himmerlich Juergen R Schaefer Stefan Krischok |
| Publication date | May 17, 2010 |
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