Simulation-aided investigation of beam hardening induced errors in CT dimensional metrology
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| Description | scholarly article by Ye Tan et al published 30 April 2014 in Measurement Science and Technology |
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author: Wim Dewulf Leonardo De Chiffre |
| Publication date | April 30, 2014 |
| Language | English |
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| Missing/wrong data? | Edit Wikidata item |