Surface study of thin epitaxial CoSi2/Si(100) layers by scanning tunneling microscopy and reflection high-energy electron diffraction
| Image |  |
|---|---|
| Description | article |
| Author/s |
author: Henning Sirringhaus |
| Publication date | January 1992 |
| Language | |
| Country of origin | |
| Wikipedia link | |
| Copyright status | |
| Missing/wrong data? | Edit Wikidata item |