Hall-Effect Measurements Probing the Degree of Charge-Carrier Delocalization in Solution-Processed Crystalline Molecular Semiconductors
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| Description | scientific article published in Physical Review Letters |
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author: Yoann Olivier Alessandro Troisi Henning Sirringhaus Takafumi Uemura |
| Publication date | August 2, 2011 |
| Language | English |
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