Search filters

Correlated fluctuations and noise spectra of tunneling and substrate currents before breakdown in thin-oxide MOS devices

Image Image of a generic work. The text above it indicates that there is no free image of the work available, and that if you own one, you can click on the placeholder link to upload it.
Description
Author/s

author: Alberto Modelli  Roberto Saletti  Piero Olivo 

Publication date 1990
Language
Country of origin
Wikipedia link
Copyright status
Missing/wrong data? Edit Wikidata item