Gated four-probe measurements on pentacene thin-film transistors: Contact resistance as a function of gate voltage and temperature
| Image |  |
|---|---|
| Description | article |
| Author/s |
author: C. Daniel Frisbie |
| Publication date | December 15, 2004 |
| Language | |
| Country of origin | |
| Wikipedia link | |
| Copyright status | |
| Missing/wrong data? | Edit Wikidata item |