Search filters

Modeling Valance Change Memristor Device: Oxide Thickness, Material Type, and Temperature Effects

Image Image of a generic work. The text above it indicates that there is no free image of the work available, and that if you own one, you can click on the placeholder link to upload it.
Description
Author/s

author: Baker Mohammad  Dirar Homouz 

Publication date December 2016
Language
Country of origin
Wikipedia link
Copyright status
Missing/wrong data? Edit Wikidata item