Missing/wrong data? Edit Wikidata item
Ion-, photoelectron- and laser-assisted analytical investigation of nano-structured mixed HfO2–SiO2 and ZrO2–SiO2 thin films
Author/s
Work details
Publication date:
August 2005
Language:
English
Copyright status
Copyright status information is not available for this work. The copyright status depends on the jurisdiction, the author's date of death and the date the work was created or published.
To learn more about copyright terms in different countries, visit the countries and terms page.