Results of the 2015 testbeam of a 180 nm AMS High-Voltage CMOS sensor prototype
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author: Marzio Nessi Francesco Lanni Kai-Feng Chen Daniel Matthias Alfred Muenstermann Joost Herman Vossebeld Tobias Golling Giuseppe Iacobucci Mathieu Benoit Lailin Xu Sergio Gonzalez-Sevilla Marco Rimoldi Didier Ferrere |
| Publication date | July 21, 2016 |
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