Chalcogenide-based van der Waals epitaxy: Interface conductivity of tellurium on Si(111)
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| Description | scholarly article by Felix Lüpke et al published 5 July 2017 in Physical Review B |
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author: Vasily Cherepanov Felix Lüpke Sven Just Gustav Bihlmayer Martina Luysberg Bert Voigtländer Jiří Doležal |
| Publication date | July 5, 2017 |
| Language | English |
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