Metrology of Wide Field of View Nano-Thickness Foils' Homogeneity by Conventional and Phase Contrast Soft X-ray Imaging
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| Description | scholarly article by Anatoly Faenov et al published 21 June 2010 in Japanese Journal of Applied Physics |
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author: Masaki Kando Toshiki Tajima Yoshiaki Kato |
| Publication date | June 21, 2010 |
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