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The XMM Cluster Survey: X-ray analysis methodology
article
Author/s
author: Ben Hoyle, Martin Sahlén, Matt Hilton, John P. Stott, Pedro T. P. Viana, Robert C. Nichol, Nicola Mehrtens, A. K. Romer, Spencer A. Stanford
Work details
Publication date
October 24, 2011
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Language
English
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