Strain in a single ultrathin silicon layer on top of SiGe islands: Raman spectroscopy and simulations
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| Description | scholarly article in Physical Review B, vol. 79 no. 7, February 2009 |
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author: Armando Rastelli Emiliano Bonera Guglielmo Vastola Fabio Pezzoli Oliver G. Schmidt |
| Publication date | February 25, 2009 |
| Language | English |
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