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Strain in a single ultrathin silicon layer on top of SiGe islands: Raman spectroscopy and simulations
scholarly article in Physical Review B, vol. 79 no. 7, February 2009
Author/s
author: Fabio Pezzoli, Emiliano Bonera, Armando Rastelli, Guglielmo Vastola, Oliver G. Schmidt
Work details
Publication date
February 25, 2009
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Language
English
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