Optimization of sample-chip design for stub-matched radio-frequency reflectometry measurements
| Image |  |
|---|---|
| Description | |
| Author/s |
author: Thomas Ihn Klaus Ensslin |
| Publication date | July 23, 2012 |
| Language | English |
| Country of origin | |
| Wikipedia link | |
| Copyright status | |
| Missing/wrong data? | Edit Wikidata item |