Micro-Raman spectroscopy for the detection of stacking fault density in InAs and GaAs nanowires
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| Description | scholarly article in Physical Review B, vol. 96 no. 16, October 2017 |
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author: Thomas Sand Jespersen Jesper Nygård Tom Vosch Sebastian Lehmann Kimberly A Dick |
| Publication date | October 19, 2017 |
| Language | English |
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