Characterization of the Excess Carrier Lifetime of As-Grown and Electron Irradiated Epitaxial p-Type 4H-SiC Layers by the Microwave Photoconductivity Decay Method
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author: Takeshi Ohshima Yoshinori Matsushita Tomoaki Hatayama Masaya Ichimura Masashi Kato |
| Publication date | April 2010 |
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