Characterization and reduction of capacitive loss induced by sub-micron Josephson junction fabrication in superconducting qubits
| Image |  |
|---|---|
| Description | scholarly article by A. Dunsworth et al published 10 July 2017 in Applied Physics Letters |
| Author/s |
author: Austin Fowler John M. Martinis Yu Zong Chen James Wenner |
| Publication date | July 10, 2017 |
| Language | English |
| Country of origin | |
| Wikipedia link | |
| Copyright status | |
| Missing/wrong data? | Edit Wikidata item |