EPR Identification of Intrinsic Defects in SiC
| Image |  |
|---|---|
| Description | |
| Author/s |
author: Takeshi Ohshima Norikazu Mizuochi Nguyen Tien Son Erik Janzén |
| Publication date | March 28, 2011 |
| Language | |
| Country of origin | |
| Wikipedia link | |
| Copyright status | |
| Missing/wrong data? | Edit Wikidata item |