Investigation on the short-circuit behavior of an aged IGBT module through a 6 kA/1.1 kV non-destructive testing equipment
| Image |  |
|---|---|
| Description | |
| Author/s |
author: Francesco Iannuzzo Frede Blaabjerg |
| Publication date | October 2014 |
| Language | |
| Country of origin | |
| Wikipedia link | |
| Copyright status | |
| Missing/wrong data? | Edit Wikidata item |