Search filters

Extension of impact-ionization multiplication coefficient measurements to high electric fields in advanced Si BJT's

Image Image of a generic work. The text above it indicates that there is no free image of the work available, and that if you own one, you can click on the placeholder link to upload it.
Description
Author/s

author: Giovanni Verzellesi 

Publication date February 1993
Language
Country of origin
Wikipedia link
Copyright status
Missing/wrong data? Edit Wikidata item