Missing/wrong data?
Log in to edit
Noise analysis of NPN SOI bipolar transistors for the design of charge measuring systems
article
Author/s
author: Gianluca Traversi, Massimo Manghisoni, Valerio Re, Lodovico Ratti
Work details
Publication date
June 2004
-
-
Copyright status
Copyright status information is not available for this work. The copyright status depends on the jurisdiction, the author's date of death and the date the work was created or published.
To learn more about copyright terms in different countries, visit the countries and terms page.