Impact of Lateral Isolation Oxides on Radiation-Induced Noise Degradation in CMOS Technologies in the 100-nm Regime
| Image |  |
|---|---|
| Description | |
| Author/s |
author: Massimo Manghisoni Lodovico Ratti Valerio Re Gianluca Traversi |
| Publication date | December 2007 |
| Language | |
| Country of origin | |
| Wikipedia link | |
| Copyright status | |
| Missing/wrong data? | Edit Wikidata item |