Beam test of a large area n-on-n silicon strip detector with fast binary readout electronics
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author: Hartmut Sadrozinski Alessandra Ciocio Marjorie D. Shapiro Yoshinobu Unno Tim Patrick Dubbs Ryuichi Takashima James L. Siegrist Hiroyuki Iwasaki Alexander Angelo Grillo Gareth F. Moorhead Carl Haber Susumu Terada Takahiko Kondo Murdock Gordon D. Gilchriese Takashi Ohsugi Edwin Spencer Takashi Kohriki |
| Publication date | June 1997 |
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