The XMM Cluster Survey: optical analysis methodology and the first data release
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author: Ben Hoyle, Martin Sahlén, John P. Stott, Pedro T. P. Viana, Mathew Smith, Matt Hilton, Edward M. Edmondson, Robert C. Nichol, Christophe Benoist, Nicola Mehrtens, A. K. Romer, Spencer A. Stanford
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