Numerical simulations for quantitative analysis of electrostatic interaction between atomic force microscopy probe and an embedded electrode within a thin dielectric: meshing optimization, sensitivity to potential distribution and impact of cantileve
| Image |  |
|---|---|
| Description | |
| Author/s |
author: Gilbert Teyssedre |
| Publication date | March 27, 2018 |
| Language | |
| Country of origin | |
| Wikipedia link | |
| Copyright status | |
| Missing/wrong data? | Edit Wikidata item |