Spectroscopic ellipsometry on Si/SiO2/graphene tri-layer system exposed to downstream hydrogen plasma: Effects of hydrogenation and chemical sputtering
| Image |  |
|---|---|
| Description | |
| Author/s |
author: Laurent Marot Ernst Meyer |
| Publication date | January 5, 2015 |
| Language | English |
| Country of origin | |
| Wikipedia link | |
| Copyright status | |
| Missing/wrong data? | Edit Wikidata item |