Radiation hardness tests and characterization of the CLARO-CMOS, a low power and fast single-photon counting ASIC in 0.35micron CMOS technology
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author: Massimiliano Fiorini Claudio Gotti Eleonora Luppi Andrea Giachero Mirco Andreotti Wander Baldini Roberto Calabrese |
| Publication date | December 2014 |
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