Measurement of proton induced radiation damage to CMOS transistors and p-i-n diodes
| Image |  |
|---|---|
| Description | article |
| Author/s |
author: Hartmut Sadrozinski Paolo Giubellino Nicolo Cartiglia Daniel Pitzl Phillip Ferguson Hermann Kolanoski Edwin Spencer |
| Publication date | June 1990 |
| Language | |
| Country of origin | |
| Wikipedia link | |
| Copyright status | |
| Missing/wrong data? | Edit Wikidata item |