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Tests of the radiation hardness of VLSI integrated circuits and silicon strip detectors for the SSC under neutron, proton, and gamma irradiation

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author: Hartmut Sadrozinski  Paolo Giubellino  Abraham Seiden  Nicolo Cartiglia  John Anthony Ellison  Stephen J. Wimpenny  Daniel Pitzl  Phillip Ferguson  Edwin Spencer 

Publication date April 1991
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