Deep n-well MAPS in a 130nm CMOS technology: Beam test results
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author: Luigi Gaioni, Gianluca Traversi, Filippo Maria Giorgi, Massimo Manghisoni, Mauro Villa, Valerio Re, Eugenio Paoloni, Giuliana Rizzo, Francesco Forti, Laura Fabbri, Stefano Bettarini, Lorenzo Vitale, Riccardo Cenci, Paola Giannetti, Alberto Lusiani, Giovanni Marchiori, Marco Bruschi, Livio Lanceri, Giuliano Pellegrini, Alessandro Gabrielli, Lodovico Ratti, Francesco Crescioli, Riccardo Di Sipio, Benedetto Giacobbe, Carla Sbarra, Roberto Spighi, Sara Valentinetti, Antonio Zoccoli
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