Thickness dependence of dielectric properties in bismuth layer-structured dielectrics
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| Description | scholarly article by Kenji Takahashi et al published 21 August 2006 in Applied Physics Letters |
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author: Osami Sakata Muneyasu Suzuki Kazumi Kato Takayuki Watanabe |
| Publication date | August 21, 2006 |
| Language | English |
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