X-ray Microdiffraction Study on Crystallinity of Micron-Sized Ge Films Selectively Grown on Si(001) Substrates
| Image |  |
|---|---|
| Description | |
| Author/s |
author: Jun Kikkawa Osami Sakata |
| Publication date | 2010 |
| Language | |
| Country of origin | |
| Wikipedia link | |
| Copyright status | |
| Missing/wrong data? | Edit Wikidata item |