Corrigendum to “Cross-sectional X-ray microdiffraction study of a thick AlN film grown on a trench-patterned AlN/α-Al2O3 template” [J. Cryst. Growth 381 (2013) 37–42, doi: 10.1016/j.jcrysgro.2013.07.012]
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| Description | scientific article |
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author: Osami Sakata Shotaro Takeuchi |
| Publication date | February 2014 |
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