Exchange bias in a ferromagnetic semiconductor induced by a ferromagnetic metal: Fe/(Ga,Mn)As bilayer films studied by XMCD measurements and SQUID magnetometry
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| Description | article |
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author: Peter Wadley Elke Arenholz Sarnjeet S. Dhesi Tom Foxon Tomáš Jungwirth Joerg Wunderlich Gerrit Van Der Laan |
| Publication date | March 3, 2010 |
| Language | English |
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