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Exchange bias in a ferromagnetic semiconductor induced by a ferromagnetic metal: Fe/(Ga,Mn)As bilayer films studied by XMCD measurements and SQUID magnetometry
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Author/s
author: Peter Wadley, Gerrit Van Der Laan, Sarnjeet S. Dhesi, Elke Arenholz, Tomáš Jungwirth, Joerg Wunderlich, Tom Foxon
Work details
Publication date
March 3, 2010
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Language
English
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