Characteristic capacitance in an electric force microscope determined by using sample surface bias effect
| Image |  |
|---|---|
| Description | article |
| Author/s |
author: Yanlian Yang |
| Publication date | June 2008 |
| Language | |
| Country of origin | |
| Wikipedia link | |
| Copyright status | |
| Missing/wrong data? | Edit Wikidata item |